X-ray Diffraction Analysis of a Class of AlMgCu Alloy Using Williamson–Hall and Scherrer Methods

AlMgCu alloy samples with 70 wt.% Al and varying Cu Mg compositions have been fabricated. The fabricated were characterized by x-ray diffraction measurement the patterns obtained. also subjected to hardness tensile tests determine mechanical properties. A study of was done average crystallite size internal strains using Scherrer’s formula Williamson–Hall analysis, assuming uniform deformation model. results show a significant variation in sizes obtained two methods, even though trend for all remained identical. This is attributed presence strain crystal system. Also, it observed that higher values correspond ductility lower Young’s modulus, ultimate strength, yield stress hardness. implies smaller ductility.